October 2013 – Dynamic Testing

Departments

• Editorial – Uses and Abuses of Finite-Element Analysis;
  Ed Alexander, 2 pp, 480 KB
   

Features

• Controlling 6-DOF Systems with Multiple Exciters; Russell Ayres,
  Marcos A. Underwood and Tony Keller, 6 pp, 1.4 MB
• Improved SRTD Testing with Resonance Phase Settings;
  Joel Minderhoud, 3 pp, 779 KB
• Dynamic Test / Analysis Products Buyer's Guide;
  3 pp, 496 KB